Analog Module Metrology Using MNABST-1 P1149.4 Test Chip.

Yue-Tsang Chen Chauchin Su

Published in: Asian Test Symposium (1998)

Keyphrases

analog vlsi
high speed
camera calibration
host computer
circuit design
mixed signal
single view
low cost
focal plane
built in self test
cmos image sensor
statistical significance
high density
low power
image sensor
multi channel
test data
case study
computer vision
neural network
real time