Automated Pattern Recognition and Defect Inspection System.
Yue CuiJesse S. JinSuhuai LuoMira ParkSherlock S. L. AuPublished in: ICIG (2009)
Keyphrases
- pattern recognition
- surface defects
- pattern recognition problems
- neural network
- signal processing
- image analysis
- image processing
- pattern analysis
- semi automated
- computer vision
- feature extraction
- visual inspection
- machine vision
- data driven
- parallel distributed processing
- computer assisted
- pattern classification
- quality control
- fully automatic
- graph matching
- computer aided
- semi automatic
- support vector machine svm
- learning environment
- decision making
- search engine