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Compaction of Compressed Bounded Transparent-Scan Test Sets.

Irith Pomeranz
Published in: ACM Great Lakes Symposium on VLSI (2022)
Keyphrases
  • test set
  • error rate
  • training set
  • test data
  • training data
  • test cases
  • evaluation methodology
  • data sets
  • image processing
  • data structure
  • lower bound
  • random selection
  • data compression
  • scan data
  • training and test sets