Backscattering from a randomly rough dielectric surface.

Adrian K. Fung Zongqian Li Kun-Shan Chen

Published in: IEEE Trans. Geosci. Remote. Sens. (1992)

Keyphrases

three dimensional
rough sets
silicon dioxide
d objects
shape index
object surface
range data
smooth surfaces
surface fitting
neural network
object recognition
surface normals
high density
randomly chosen