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The Complexity of Fault Detection Problems for Combinational Logic Circuits.

Hideo FujiwaraShunichi Toida
Published in: IEEE Trans. Computers (1982)
Keyphrases
  • fault detection
  • logic circuits
  • industrial processes
  • fault diagnosis
  • low power
  • genetic algorithm
  • condition monitoring
  • fuzzy logic
  • np complete
  • power consumption
  • fault detection and diagnosis
  • robust fault detection