Automatic Scan Insertion and Test Generation for Asynchronous Circuits.

Frank te Beest Ad M. G. Peeters Marc Verra Kees van Berkel Hans G. Kerkhoff

Published in: ITC (2002)

Keyphrases

asynchronous circuits
test generation
test cases
test sequences
process algebra
design automation
static analysis
software testing
quality assurance
delay insensitive
mutation testing
test data generation
image processing
feature space
model checking
low power