DefSim: CMOS Defects on Chip for Research and Education.
Witold A. PleskaczTomasz BorejkoA. WalkanisViera StopjakováArtur JutmanRaimund UbarPublished in: LATW (2006)
Keyphrases
- analog vlsi
- high speed
- circuit design
- low cost
- cmos image sensor
- single chip
- chip design
- cmos technology
- distance learning
- focal plane
- random access memory
- low power
- image sensor
- information and communication technologies
- dynamic range
- hong kong
- nm technology
- distance education
- programmable logic
- higher education
- e learning
- high density
- lifelong learning
- university level
- power dissipation
- defect detection
- imaging systems
- st century
- power consumption
- mobile learning
- power supply
- real time
- hybrid learning
- problem based learning
- low voltage
- mixed signal
- educational technology
- parallel processing
- learning process
- defect classification
- analog to digital converter