BIST-oriented test pattern generator for detection of transition faults.

Takeshi Asakawa Kazuhiko Iwasaki Seiji Kajihara

Published in: Systems and Computers in Japan (2003)

Keyphrases

pattern generator
built in self test
integrated circuit
false positives
detection algorithm
automatic detection
test cases
detection accuracy
detection rate
false alarms
detection method
data sets
object detection
anomaly detection
level set
multiple faults
image segmentation