Takeshi Asakawa

Publication Activity (10 Years)

Years Active: 2001-2008
Publications (10 Years): 0

Publications

Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, Takeshi Asakawa
Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development. J. Inf. Process. Syst. 4 (4) (2008)
Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara
BIST-oriented test pattern generator for detection of transition faults. Systems and Computers in Japan 34 (3) (2003)
Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara
Hybrid BIST Using Partially Rotational Scan. Asian Test Symposium (2001)
Takeshi Asakawa, Kazuhiko Iwasaki
Using ATPG vectors for BIST test pattern generator. Systems and Computers in Japan 32 (11) (2001)