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Using ATPG vectors for BIST test pattern generator.

Takeshi AsakawaKazuhiko Iwasaki
Published in: Systems and Computers in Japan (2001)
Keyphrases
  • optical flow
  • pattern generator
  • built in self test
  • data sets
  • genetic algorithm
  • feature vectors
  • databases
  • data mining
  • machine learning
  • information retrieval
  • information systems
  • bayesian networks