Kenichi Ichino

Publication Activity (10 Years)

Years Active: 2001-2008
Publications (10 Years): 0

Publications

Masayuki Sato, Hiroki Wakamatsu, Masayuki Arai, Kenichi Ichino, Kazuhiko Iwasaki, Takeshi Asakawa
Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development. J. Inf. Process. Syst. 4 (4) (2008)
Kenichi Ichino, Ko-ichi Watanabe, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki
Application of Partially Rotational Scan Technique with Tester IP for Processor Circuits. IEICE Trans. Inf. Syst. (3) (2004)
Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki
Seed Selection Procedure for LFSR-Based BIST with Multiple Scan Chains and Phase Shifters. Asian Test Symposium (2004)
Kenichi Ichino, Ko-ichi Watanabe, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki
Seed Selection Procedure for LFSR-Based Random Pattern Generators. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (12) (2003)
Kenichi Ichino, Ko-ichi Watanabe, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki
A seed selection procedure for LFSR-based random pattern generators. ASP-DAC (2003)
Yuki Yamagata, Kenichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Masayuki Satoh, Hiroyuki Itabashi, Takashi Murai, Nobuyuki Otsuka
Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. Asian Test Symposium (2003)
Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara
Hybrid BIST Using Partially Rotational Scan. Asian Test Symposium (2001)