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Test Pattern Considerations for Fault Tolerant High Density DRAM.
Hiroshi Miyamoto
Koichiro Mashiko
Yoshikazu Morooka
Kazutami Arimoto
Michihiro Yamada
T. Nakano
Published in:
ITC (1985)
Keyphrases
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high density
fault tolerant
fault tolerance
low density
distributed systems
close proximity
high power
data center
thin film
high bandwidth
magnetic recording
load balancing
high availability
state machine
magnetic tape
interconnection networks
data mining
mathematical analysis
test cases
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