Boolean and current detection of MOS transistor with gate oxide short.
Michel RenovellJean Marc GallièreFlorence AzaïsSerge BernardYves BertrandPublished in: ITC (2001)
Keyphrases
- leakage current
- silicon dioxide
- low voltage
- field effect transistors
- power line
- high speed
- detection algorithm
- detection method
- automatic detection
- real valued
- genetic algorithm
- detection rate
- low power
- hough transform
- electrical properties
- false alarms
- data sets
- false positives
- low cost
- object detection
- object recognition
- decision trees
- data mining