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Investigation into the correct statistical distribution for oxide breakdown over oxide thickness range.
James Prendergast
Eoin O'Driscoll
Ed Mullen
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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statistical distribution
fuel cell
statistical model
leakage current
room temperature
electrical properties
electron microscopy
si sio
statistical distributions
information retrieval
training set
unsupervised learning
probability density function
low voltage
silicon dioxide
gate insulator