Bias temperature instability and condition monitoring in SiC power MOSFETs.

Jose Angel Ortiz Gonzalez Olayiwola Alatise

Published in: Microelectron. Reliab. (2018)

Keyphrases

condition monitoring
fault diagnosis
fault detection
acoustic emission
power consumption
power transformers
tool wear
nuclear power plant
electrical power
neural network
reliability analysis
room temperature
total energy
cutting tool
low voltage