Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates.
Arnaud CurutchetNathalie MalbertNathalie LabatAndré TouboulChristophe GaquièreA. MinkoMichael J. UrenPublished in: Microelectron. Reliab. (2003)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- high density
- subband
- frequency band
- discrete wavelet transform
- wavelet coefficients
- wavelet analysis
- image processing
- low pass
- high frequency components
- electromagnetic fields
- multiresolution
- multiscale
- original images
- random noise
- machine learning
- low and high frequency
- wavelet domain
- filter bank
- image data
- high resolution
- feature extraction