Statistical Timing for Parametric Yield Prediction of Digital Integrated Circuits.
Jochen A. G. JessKerim KalafalaSrinath R. NaiduRalph H. J. M. OttenChandramouli VisweswariahPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
- integrated circuit
- prediction accuracy
- prediction model
- electron beam
- prediction algorithm
- statistical analysis
- statistical tests
- printed circuit boards
- statistical modeling
- digital media
- data sets
- statistical methods
- statistical models
- data driven
- prediction error
- statistical information
- linear prediction
- image analysis
- image processing
- neural network