Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA.
Victor O. CostaFabio BenevenutiRenan MenezesLidia Shibuya SatoLuis LouresFernanda Lima KastensmidtNemitala AddedSaulo G. AlbertonVitor A. P. AguiarNilberto H. MedinaPublished in: LATS (2024)
Keyphrases
- low cost
- single chip
- low power
- high speed
- fault diagnosis
- power reduction
- embedded systems
- power consumption
- dynamic random access memory
- general purpose
- control system
- data transmission
- field programmable gate array
- fault detection
- hardware implementation
- real time
- programmable logic
- hw sw
- general purpose processors
- digital signal processors
- reinforcement learning
- real time image processing
- behavioural cloning
- error detection
- controller design
- hardware architecture
- fault detection and diagnosis
- fault model
- closed loop