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Effect of high temperature aging on reliability of automotive electronics.
Dao-Guo Yang
F. F. Wan
Z. Y. Shou
Willem D. van Driel
H. Scholten
L. Goumans
Roberto Faria
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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high temperature
software aging
artificial intelligence
reliability analysis
electrical engineering
reliability assessment