L. Goumans

Publication Activity (10 Years)

Years Active: 2011-2011
Publications (10 Years): 0

Publications

Dao-Guo Yang, F. F. Wan, Z. Y. Shou, Willem D. van Driel, H. Scholten, L. Goumans, Roberto Faria
Effect of high temperature aging on reliability of automotive electronics. Microelectron. Reliab. 51 (9-11) (2011)