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SAT-based techniques for determining backbones for post-silicon fault localisation.

Charlie Shucheng ZhuGeorg WeissenbacherDivjyot SethiSharad Malik
Published in: HLDVT (2011)
Keyphrases
  • fault diagnosis
  • fault detection
  • answer set programming
  • high density
  • low cost
  • high speed
  • sat solvers
  • bounded model checking
  • neural network
  • domain specific
  • sat encodings
  • fault model
  • multiple faults