DV-TSE: Difference Vector Based Test Set Embedding.

Maciej Bellos Xrysovalantis Kavousianos Dimitris Nikolos Dimitri Kagaris

Published in: VLSI-SOC (2003)

Keyphrases

test set
vector space
training set
error rate
test data
test cases
evaluation methodology
training data
cost model
class distribution
feature vectors
multi class
training and test sets
machine learning
object recognition
image sequences
image processing