Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based Decision Problems.
Desta TadesseR. Iris BaharJoel GrodsteinPublished in: J. Electron. Test. (2011)
Keyphrases
- decision problems
- influence diagrams
- test cases
- decision model
- computational complexity
- optimal policy
- test data
- optimal strategy
- decision processes
- utility function
- software testing
- multiple criteria
- sequential decision making
- test generation
- answer set programming
- bayesian decision problems
- test suite
- np hard
- partially observable
- probabilistic inference
- minimax regret