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Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL Circuits.
Loganathan Lingappan
Vijay Gangaram
Niraj K. Jha
Sreejit Chakravarty
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2009)
Keyphrases
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test set
error rate
training set
training data
test data
evaluation methodology
test cases
image enhancement
delay insensitive
model based diagnosis
classification accuracy
image processing
high speed
decision trees
data mining
electronic circuits
neural network