On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST.

Florence Azaïs Serge Bernard Yves Bertrand Michel Renovell

Published in: VLSI-SOC (2001)

Keyphrases

built in self test
integrated circuit
high speed
test data
statistical tests
high density
analog vlsi
database
neural network
pseudorandom
single chip
physical design