Built-in-self-test technique for diagnosis of delay faults in cluster-based field programmable gate arrays.
Nachiketa DasPranab RoyHafizur RahamanPublished in: IET Comput. Digit. Tech. (2013)
Keyphrases
- built in self test
- field programmable gate array
- integrated circuit
- hardware description language
- hardware implementation
- fault diagnosis
- fpga technology
- programmable logic
- fault detection
- embedded systems
- model based diagnosis
- parallel computing
- multiple faults
- hardware design
- image processing algorithms
- parallel architectures
- computing systems
- hardware architecture
- fault detection and diagnosis
- host computer
- parallel programming
- digital signal processing
- high end
- software implementation
- digital signal processors
- application specific integrated circuits
- massively parallel
- clock frequency
- fpga device
- signal processing
- fault model
- hardware software
- efficient implementation
- general purpose processors
- hardware software co design
- image processing
- real time