VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests.
Sabyasachi DeyatiAritra BanerjeeBarry John MuldreyAbhijit ChatterjeePublished in: VLSI Design (2013)
Keyphrases
- mixed signal
- cmos technology
- low power
- vlsi circuits
- multi channel
- high speed
- low cost
- digital circuits
- diagnostic tests
- power consumption
- model based diagnosis
- low voltage
- diagnostic process
- fault diagnosis
- parallel processing
- relevance feedback
- signature verification
- radio frequency
- image sensor
- signature scheme
- power dissipation
- real time
- pattern recognition
- fault models
- analog to digital converter
- digital signal processing
- circuit design
- high density