Designing for high-level test generation.
Debashis BhattacharyaJohn P. HayesPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
- test generation
- high level
- test cases
- low level
- design automation
- symbolic execution
- test sequences
- higher level
- static analysis
- quality assurance
- data sets
- programming language
- test data generation
- software testing
- mutation testing
- test set
- test suite
- error rate
- relational databases
- training data
- code coverage
- database systems