A 28nm high density 1R/1W 8T-SRAM macro with screening circuitry against read disturb failure.
Makoto YabuuchiHidehiro FujiwaraYasumasa TsukamotoMiki TanakaShinji TanakaKoji NiiPublished in: CICC (2013)
Keyphrases
- high density
- low density
- power consumption
- data center
- magnetic recording
- close proximity
- high power
- leakage current
- thin film
- data transmission
- high bandwidth
- cmos technology
- low power
- failure rate
- field effect transistors
- cervical cancer
- dynamic random access memory
- low cost
- circuit design
- drug discovery
- design considerations
- random access
- image analysis
- transmission electron microscopy
- chemical vapor deposition
- data streams
- real time