Sign in
Admittance spectroscopy for planar and across measure configuration of metal/porous silicon/Si structures.
Andrzej Korcala
Zbigniew Lukasiak
Anna Zawadzka
Przemyslaw Plóciennik
Waclaw Bala
Miroslaw Boniewiez
Published in:
ICTON (2014)
Keyphrases
</>
field effect transistors
chemical vapor deposition
metal oxide
x ray
si sio
gallium arsenide
distance measure
steady state
similarity measure
high density
infrared
low cost
thin film
mathematical analysis
electron microscopy
evaluation measures
information content
correlation coefficient