Reducing test cost through the use of digital testers for analog tests.

John Sweeney Alan Tsefrekas

Published in: ITC (2005)

Keyphrases

test cases
test suite
test data
testing process
test generation
statistical tests
post hoc
circuit design
null hypothesis
software testing
multiple choice
unit testing
high cost
cost reduction
analog circuits
minimum cost
data conversion
expected cost
software development
real time
mixed signal
code coverage
database