An Optimal Design for Parallel Test Generation Based on Circuit Partitioning.
Dong XiangDaozheng WeiPublished in: VLSI Design (1994)
Keyphrases
- optimal design
- test generation
- test cases
- water supply
- design automation
- test sequences
- symbolic execution
- static analysis
- software testing
- high speed
- mutation testing
- quality assurance
- parallel processing
- machine learning
- structural design
- shared memory
- circuit design
- data management
- training data
- information systems
- databases
- code coverage
- database