Daozheng Wei

Publication Activity (10 Years)

Years Active: 1986-1996
Publications (10 Years): 0

Publications

Yin Shi, Daozheng Wei
Accelerated techniques in stem fault simulation. J. Comput. Sci. Technol. 11 (6) (1996)
Dong Xiang, Daozheng Wei
GLOBAL: A design for random testability algorithm. J. Comput. Sci. Technol. 9 (2) (1994)
Dong Xiang, Daozheng Wei
An Optimal Design for Parallel Test Generation Based on Circuit Partitioning. VLSI Design (1994)
Qingfang Chen, Daozheng Wei
DLJ: A dynamic line-justification algorithm for test generation. J. Comput. Sci. Technol. 8 (1) (1993)
Yunzhan Gong, Daozheng Wei
Deductive fault simulation algorithm based on fault collapsing. J. Comput. Sci. Technol. 8 (2) (1993)
Dong Xiang, Daozheng Wei, Shisong Chen
A Global Test Point Placement Algorithm of Combinational Circuits. VLSI Design (1992)
Jian-Cao Wang, Daozheng Wei
A New Testability Measure for Digital Circuits. ITC (1986)