A Global Test Point Placement Algorithm of Combinational Circuits.
Dong XiangDaozheng WeiShisong ChenPublished in: VLSI Design (1992)
Keyphrases
- preprocessing
- learning algorithm
- computational complexity
- objective function
- detection algorithm
- cost function
- np hard
- high accuracy
- estimation algorithm
- selection algorithm
- matching algorithm
- optimization algorithm
- theoretical analysis
- linear programming
- worst case
- hardware implementation
- computational cost
- expectation maximization
- segmentation algorithm
- neural network
- k means
- memory requirements
- data sets
- improved algorithm
- recognition algorithm
- times faster
- similarity measure
- significant improvement
- dynamic programming
- high speed
- probabilistic model