Deep Neural Networks for Determining Subgap States of Oxide Thin-Film Transistors.
Yun-Yeong ChoiWookyung SunJisun ParkHyungsoon ShinPublished in: IEEE Access (2023)
Keyphrases
- thin film
- high density
- neural network
- electron microscopy
- room temperature
- silicon nitride
- multi layer
- field effect transistors
- short circuit
- artificial neural networks
- solar cell
- low density
- integrated circuit
- plasma etching
- neural network model
- grain size
- genetic algorithm
- power consumption
- data center
- back propagation
- high speed
- fault diagnosis
- fuzzy logic
- multi view
- electrical properties
- fuel cell