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Test generation and optimization for DRAM cell defects using electrical simulation.
Zaid Al-Ars
Ad J. van de Goor
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2003)
Keyphrases
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test generation
test cases
low voltage
symbolic execution
printed circuit boards
design automation
main memory
software testing
static analysis
quality assurance
test sequences
mutation testing
artificial intelligence
multi agent
relational databases
open source