Reliability challenges in Forksheet Devices: (Invited Paper).
Erik BuryMichiel VandemaeleJacopo FrancoAdrian ChasinStanislav TyaginovA. VandoorenRomain RitzenthalerHans MertensJavier Diaz-FortunyN. HoriguchiDimitri LintenBen KaczerPublished in: IRPS (2023)