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An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing.
Chen-Yuan Yang
Xuan-Lun Huang
Jiun-Lang Huang
Published in:
Asian Test Symposium (2009)
Keyphrases
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analog vlsi
high speed
circuit design
chip design
low cost
cmos technology
random access memory
vlsi implementation
power dissipation
metal oxide
tunnel diode
power supply
high density
test cases
transmission line
asynchronous circuits
mixed signal
test set
evolutionary algorithm
real time