• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

On Maximizing the Coverage of Catastrophic and Parametric Faults.

Anna Maria BrosaJoan Figueras
Published in: J. Electron. Test. (2000)
Keyphrases
  • fault diagnosis
  • fault detection
  • fault model
  • semi parametric
  • machine learning
  • computer vision
  • learning environment
  • artificial neural networks
  • parametric models
  • fault detection and diagnosis