A Parallel Approach Solving the Test Generation Problem for Synchronous Sequential Circuits.

H.-Ch. Dahmen Uwe Gläser Heinrich Theodor Vierhaus

Published in: PARCO (1997)

Keyphrases

test generation
test cases
symbolic execution
test sequences
design automation
quality assurance
parallel version
software testing
static analysis
mutation testing
machine learning
open source
high speed
shared memory
information technology
object oriented