Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits.

Peter A. Krauss Andreas Ganz Kurt Antreich

Published in: J. Electron. Test. (1997)

Keyphrases

distributed systems
fault diagnosis
distributed environment
multi agent
lightweight
analog circuits
test cases
real time
computer networks
distributed database systems
high speed
mobile agents
expert systems
communication overhead
distributed architecture
fault detection and diagnosis
fault model
built in self test