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Broadside Tests for Transition and Stuck-At Faults.

Irith Pomeranz
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
  • test cases
  • fault diagnosis
  • fault detection
  • decision trees
  • test data
  • search algorithm
  • abnormal events
  • learning algorithm
  • expert systems
  • hidden markov models
  • multiple choice
  • diagnostic tests