Login / Signup
Embedded Deterministic Test for Low-Cost Manufacturing.
Janusz Rajski
Mark Kassab
Nilanjan Mukherjee
Nagesh Tamarapalli
Jerzy Tyszer
Jun Qian
Published in:
IEEE Des. Test Comput. (2003)
Keyphrases
</>
low cost
embedded systems
manufacturing industry
quality control
hardware and software
decision making
digital images
test data
genetic algorithm
low power
manufacturing systems
databases
statistical tests
data sets
rfid tags
manufacturing processes
real time