Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns.
Jan SchatPublished in: DDECS (2008)
Keyphrases
- fault diagnosis
- fault detection
- fault model
- multiple faults
- real time
- fault detection and isolation
- industrial processes
- data sets
- fault detection and diagnosis
- data mining techniques
- frequent patterns
- software development
- pattern discovery
- model based diagnosis
- knowledge discovery
- expert systems
- genetic algorithm
- machine learning
- data mining
- databases