Toward massively parallel automatic test generation.
Srimat T. ChakradharMichael L. BushnellVishwani D. AgrawalPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
- massively parallel
- test generation
- fine grained
- test cases
- parallel computing
- high performance computing
- symbolic execution
- quality assurance
- static analysis
- test sequences
- design automation
- parallel machines
- data sets
- error rate
- parallel computers
- parallel architectures
- quality assessment
- open source
- query language
- computational complexity
- database systems
- image processing