Test Bench for Highly Segmented GRIT Double-Sided Silicon Strip Detectors: A Detector Quality Control Protocol.
José Antonio DueñasAlex CoboLuis LópezFranco GaltarossaAlain GoasduffDaniele MengoniÁngel Miguel Sánchez BenítezPublished in: Sensors (2023)
Keyphrases
- quality control
- negative selection algorithm
- machine vision
- quality assurance
- interest point detectors
- feature detectors
- manufacturing systems
- lightweight
- corner detectors
- manufacturing process
- product quality
- object detectors
- low cost
- automated visual inspection
- object detection
- anomaly detection
- corner detection
- high density
- high speed
- petri net
- detection method
- communication protocol
- detection algorithm
- cryptographic protocols
- feature points