CORNER DETECTORS
Experts
- Baojiang Zhong
- Guojun Lu
- Farzin Mokhtarian
- Xun Sun
- Mohammad Awrangjeb
- Weichuan Zhang
- Shizheng Zhang
- Changming Sun
- Han Wang
- Meiqing Wu
- Azhar Quddus
- Muhammad Sarfraz
- Xiaohong Zhang
- Thambipillai Srikanthan
- Siew Kei Lam
- Adrian F. Clark
- Dan Yang
- Nirmala Ramakrishnan
- Nadia Kanwal
- Chiara Bartolozzi
- Dermot Kerr
- Shoaib Ehsan
- Robert M. Haralick
- Sonya A. Coleman
- Asif Masood
- Sheng Huang
- Erik Cuevas
- Gauthier Lafruit
- Mauricio Delbracio
- Bertrand Kerautret
- R. Dinesh
- Francisco Sandoval Hernández
- Yongsheng Gao
- Andrew D. J. Cross
- Rajiv Mehrotra
- Riku Suomela
- Edwin R. Hancock
- D. S. Guru
- Yung-Nien Sun
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- Multim. Tools Appl.
- Image Vis. Comput.
- ICPR
- CVPR
- IEEE Trans. Image Process.
- BMVC
- EUSIPCO
- ICIP
- ICCV
- ICRA
- IEEE Access
- DICTA
- ROBIO
- Neurocomputing
- ISVC (1)
- IEEE Signal Process. Lett.
- IGARSS
- IROS
- IEEE Trans. Inf. Theory
- IET Image Process.
- TSP
- CVPR Workshops
- ICIAP
- ICIP (1)
- Remote. Sens.
- EMBC
- IEICE Trans. Inf. Syst.
- VISAPP (1)
- ISCAS
- 3DIMPVT
- CGIV
- Mach. Vis. Appl.
- SSPR/SPR
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