CORNER DETECTORS
Experts
- Baojiang Zhong
- Guojun Lu
- Meiqing Wu
- Han Wang
- Changming Sun
- Weichuan Zhang
- Shizheng Zhang
- Mohammad Awrangjeb
- Farzin Mokhtarian
- Xun Sun
- Adrian F. Clark
- Dan Yang
- Thambipillai Srikanthan
- Siew Kei Lam
- Xiaohong Zhang
- Muhammad Sarfraz
- Azhar Quddus
- Sheng Huang
- Asif Masood
- Sonya A. Coleman
- Robert M. Haralick
- Shoaib Ehsan
- Dermot Kerr
- Chiara Bartolozzi
- Nadia Kanwal
- Nirmala Ramakrishnan
- Ricardo Vázquez MartÃn
- Edward Rosten
- Neeta Nain
- Olivier Rioul
- Bin Luo
- Xining Zhang
- Antonio Bandera
- Tom Drummond
- Clive S. Fraser
- Junfeng Jing
- Bhavitavya Bhadviya
- Klaus D. McDonald-Maier
- Jiann-Shu Lee
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- Multim. Tools Appl.
- Image Vis. Comput.
- ICPR
- CVPR
- IEEE Trans. Image Process.
- BMVC
- EUSIPCO
- ICIP
- ICCV
- ICRA
- IEEE Access
- DICTA
- ROBIO
- Neurocomputing
- IGARSS
- ISVC (1)
- IEEE Signal Process. Lett.
- IEEE Trans. Inf. Theory
- IET Image Process.
- IROS
- CVPR Workshops
- TSP
- Remote. Sens.
- ICIAP
- ICIP (1)
- VISAPP (1)
- ISCAS
- 3DIMPVT
- EMBC
- IEICE Trans. Inf. Syst.
- Mach. Vis. Appl.
- CGIV
- IEEE Trans. Very Large Scale Integr. Syst.
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