CORNER DETECTORS
Experts
- Baojiang Zhong
- Guojun Lu
- Han Wang
- Meiqing Wu
- Mohammad Awrangjeb
- Xun Sun
- Farzin Mokhtarian
- Changming Sun
- Shizheng Zhang
- Weichuan Zhang
- Dan Yang
- Adrian F. Clark
- Siew Kei Lam
- Thambipillai Srikanthan
- Xiaohong Zhang
- Muhammad Sarfraz
- Azhar Quddus
- Sonya A. Coleman
- Robert M. Haralick
- Sheng Huang
- Asif Masood
- Chiara Bartolozzi
- Nadia Kanwal
- Nirmala Ramakrishnan
- Shoaib Ehsan
- Dermot Kerr
- Kwanghoon Sohn
- Arcot Sowmya
- Kai-Kuang Ma
- Moncef Gabbouj
- Chin-Hsing Chen
- Srikanth Sastry
- Zhifeng Zhang
- Ricardo Vázquez Martín
- Edward Rosten
- Neeta Nain
- Olivier Rioul
- Bin Luo
- Xining Zhang
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Sensors
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- Multim. Tools Appl.
- IEEE Trans. Image Process.
- BMVC
- CVPR
- ICPR
- EUSIPCO
- ICIP
- ROBIO
- IEEE Access
- DICTA
- ICRA
- ICCV
- IEEE Trans. Inf. Theory
- IET Image Process.
- IROS
- IGARSS
- IEEE Signal Process. Lett.
- ISVC (1)
- Neurocomputing
- Mach. Vis. Appl.
- CGIV
- 3DIMPVT
- ISCAS
- VISAPP (1)
- IEICE Trans. Inf. Syst.
- EMBC
- Remote. Sens.
- ICIP (1)
- ICIAP
- CVPR Workshops
- TSP
- IECON
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