CORNER DETECTORS
Experts
- Baojiang Zhong
- Guojun Lu
- Shizheng Zhang
- Meiqing Wu
- Mohammad Awrangjeb
- Changming Sun
- Weichuan Zhang
- Xun Sun
- Han Wang
- Farzin Mokhtarian
- Dan Yang
- Siew Kei Lam
- Thambipillai Srikanthan
- Muhammad Sarfraz
- Adrian F. Clark
- Xiaohong Zhang
- Azhar Quddus
- Shoaib Ehsan
- Dermot Kerr
- Robert M. Haralick
- Nirmala Ramakrishnan
- Nadia Kanwal
- Sheng Huang
- Sonya A. Coleman
- Asif Masood
- Chiara Bartolozzi
- Jiann-Shu Lee
- Ricardo Vázquez Martín
- Xining Zhang
- Erik Cuevas
- Vijay Laxmi
- Yongsheng Gao
- Naresh R. Shanbhag
- Bryan W. Scotney
- Olivier Rioul
- Chin-Hsing Chen
- Antonio Bandera
- R. Dinesh
- Jacques-Olivier Lachaud
Venues
- CoRR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- Multim. Tools Appl.
- ICPR
- BMVC
- IEEE Trans. Image Process.
- CVPR
- ICASSP
- EUSIPCO
- ICIP
- ROBIO
- ICRA
- DICTA
- ICCV
- IROS
- Neurocomputing
- ISVC (1)
- IEEE Access
- IGARSS
- IEEE Trans. Inf. Theory
- IET Image Process.
- IEEE Signal Process. Lett.
- ICIP (1)
- VISAPP (1)
- CVPR Workshops
- ICIAP
- TSP
- EMBC
- Remote. Sens.
- Mach. Vis. Appl.
- CGIV
- IEICE Trans. Inf. Syst.
- 3DIMPVT
- FPL
- ISCAS
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