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A built-in test module for fault isolation.

Nagesh VasanthavadaNick Kanopoulos
Published in: IEEE Des. Test (1989)
Keyphrases
  • fault isolation
  • diagnostic tests
  • genetic algorithm
  • fault tolerant
  • fault detection
  • fault diagnosis
  • physical systems
  • knowledge base
  • test cases
  • code generation
  • fault localization