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An advanced test system architecture for synchronous and asynchronous control of mixed signal device testing.
Jun Kurita
Nobuyuki Kasuga
Kiyoyasu Hiwada
Published in:
ITC (1990)
Keyphrases
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mixed signal
test cases
multi channel
test data
low power
vlsi circuits
test suite
software testing
data acquisition
test generation
low cost
statistical tests
digital circuits
control system
design considerations