A sub-region one-to-one mapping (SOM) detection algorithm for glass passivation parts wafer surface low-contrast texture defects.
Jin WangZhiyong YuZhizhao DuanGuodong LuPublished in: Multim. Tools Appl. (2021)
Keyphrases
- detection algorithm
- low contrast
- intensity variations
- gray level
- high contrast
- space charge
- defect detection
- blood vessels
- detection method
- fully automatic
- background noise
- detection rate
- image regions
- detection accuracy
- motion detection
- corner detection
- high noise
- input image
- object contours
- textural features
- vehicle detection
- three dimensional
- gray value
- contrast enhancement
- texture features
- moving objects
- harris corner
- region of interest
- image structure
- energy function
- particle filter
- cell nuclei
- feature vectors
- image segmentation